A scanning electron microscope can identify differences in the composition of soil and rock samples and determine the effects of weathering on materials. A scanning electron microscope (SEM) projects and scans a concentrated flow of electrons onto a surface to create an image. The electrons in the beam interact with the sample, thus producing several signals that can be used to obtain information about the topography and composition of the surface. A scanning electron microscope (SEM) scans a beam of electrons focused on a surface to produce an image.
The electrons in the beam interact with the sample, creating different signals that can be used to obtain information about the topography and composition of the surface.
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