Scanning electron microscopy (SEM) is a testing process that scans a sample with an electron beam to produce an enlarged image for analysis. The method is also known as SEM analysis and SEM microscopy, and is used very effectively in the microanalysis and fault analysis of solid inorganic materials. The scanning electron microscope (SEM) produces images by scanning the sample with a beam of high-energy electrons. As the electrons interact with the sample, they produce secondary electrons, backscattered electrons, and characteristic X-rays.
These signals are collected by one or more detectors to form images that are then displayed on the computer screen. When the electron beam hits the surface of the sample, it penetrates the sample to a depth of a few microns, depending on the acceleration voltage and the density of the sample. Many signals, such as secondary electrons and X-rays, are produced as a result of this interaction within the sample. First, it allows the introduction of a gaseous environment into the sample chamber, although the electron gun remains under the SEM standard for high vacuum.
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