A scanning electron microscope (SEM) is a type of microscope that uses a focused beam of electrons to scan the surface of a sample and create a high-resolution image. The SEM produces images that can show information about the composition of the surface and the topography of a material. A scanning electron microscope (SEM) projects and scans a concentrated flow of electrons onto a surface to create an image. The electrons in the beam interact with the sample, thus producing various signals that can be used to obtain information about the topography and composition of the surface.
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